Monday, January 28
1:30 PM – 4:30 PM	Challenges and Solutions in Characterizing a 10 Gb Device - Location: Mission City Ballroom M2 As signal speeds have increased measuring jitter hasn’t become any easier, in fact, it’s become even more difficult. Most designers have been measuring jitter for most of their careers; ho… More ▶ Sponsored Session Presenter - Robert Sleigh, Senior Product Manager, Agilent Rob Sleigh is a Product Marketing Engineer for sampling scopes in Agilent Technologies’ Oscilloscope Products Division. He is responsible for product development for the division’s high-speed electrical and optical digital communications analyzer and jitter test products. Rob’s experience at Agilent Technologies/Hewlett-Packard includes 5 years in technical support, and over 8 years in sales and technical marketing. Prior to working at Agilent Technologies/HP, Rob worked for 10 years at Westel Telecommunications in Vancouver, British Columbia, Canada, designing microwave and optical telecommunication networks. Rob earned his B.S.E.E. degree from the University of Victoria. Sponsored Session Presenter - Greg LeCheminant, Technical Applications Engineer, Agilent Technologies Sponsored Session Presenter - Brian Fetz, Marketing, Agilent Technologies
3:00 PM – 4:30 PM	PCI Express 3.0 Characterization, Compliance, and Debug for Signal Integrity Engineers - Location: Mission City Ballroom M1 At 8 Gb/s, PCI Express 3.0 presents new design and signal integrity challenges, including new requirements. This session will discuss the challenges of compliance testing and demonstrate advanced debu… More ▶ Sponsored Session Presenter - David Li, Technical Product Manager, Serial Data, Teledyne LeCroy David Li holds a Master of Science in Electrical Engineering from Stevens Institute of Technology, Hoboken NJ, and a BS (Electrical Engineering from Boston University, College of Engineering. David currently specializes in high-speed serial standards and signal integrity tests for PCIe Gen3, SFP+, 10GbaseKR, 10GbaseT, and MIPI-MPHY. David is also an active participant in key serial data standard bodies such as PCI-SIG, USB-IF, MIPI Alliance, SATA-IO, T10, VESA, JEDEC, OIF and IEEE 802.3 committees.
Tuesday, January 29
8:30 AM – 9:10 AM	Synchronous Time and Frequency Domain Measurements Using a Digital Oscilloscope - Location: Mission City Ballroom M3 Embedded systems increasingly employ digital, analog and RF signals all of which are tightly synchronized in time. Debugging these systems is challenging in that one needs to measure a number of diffe… More ▶ Sponsored Session Presenter - Mike Schnecker, Business Development Manager, Rohde & Schwarz Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.
9:20 AM – 10:00 AM	Ensuring Validation & Analysis of Complex Serial Bus Link Models - Location: Mission City Ballroom M1 This session discusses a method for providing accurate complex link visibility in serial data communications system designs where PHY timing margins are shrinking, eye diagrams are closed and probing … More ▶ Sponsored Session Presenter - John Pickerd, Principal Engineer, Tektronix John Pickerd is a Principal Engineer at Tektronix. He has worked since 1988 on DSP for high performance oscilloscopes as well as many other attributes of the system design. Currently he is involved in the design and implementation of SDLA, serial data link analysis scope application. He holds 24 patents and a BS degree in electrical engineering from Oregon State University and an associate degree in electrical engineering technology from Blue Mountain Community College in Oregon. Sponsored Session Presenter - Kan Tan, Senior Software Engineer, Tektronix Kan Tan is a senior software engineer at Tektronix. He has worked on DSP for performance scopes; signal integrity analysis such as jitter, PLL and BER estimation; serial data link analysis including equalizers, channel embed/de-embed. He holds 13 patents. Co-authored a book chapter. He received a Ph.D. degree from University of Houston. USB 2.0 Compliance Testing - Location: Mission City Ballroom M3 The USB 2.0 standard is widely deployed in both computer and embedded systems. Compliance testing for this standard includes signal integrity as well as a number of low-level protocol tests. This sess… More ▶ Sponsored Session Presenter - Mike Schnecker, Business Development Manager, Rohde & Schwarz Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.
10:15 AM – 10:55 AM	Phase Noise and Jitter Measurements - Location: Mission City Ballroom M3 Jitter is a very important topic in signal integrity for high speed serial data links. The jitter performance of clock signals used in generating the serial data signal is critical to the overall perf… More ▶ Sponsored Session Presenter - Rick Daniel, Application Engineer, Rohde & Schwarz Rick Daniel has a BSEE from Texas Tech University and an MSEE from SMU. He has 30 years of experience in RF and microwave design and measurement with expertise in spectrum analysis, network analysis and communications. Prior to joining Rohde & Schwarz, Mr. Daniel held positions at Texas Instruments, Raytheon, HP and Agilent Technologies.
11:05 AM – 11:45 AM	True Differential S-parameter Measurements - Location: Mission City Ballroom M3 Differential structures such as backplanes and cables are the primary means for transmitting high speed serial data signals. Signal integrity of these systems is determined by the characteristics of t… More ▶ Sponsored Session Presenter - Chris Scholz, Ph.D, Product Manager, Rohde & Schwarz Chris Scholz has a Ph.D. (Electrical Engineering) and an MS from Georgia Tech, in addition to an MS from the TU Carolo-Wilhelmina in Braunschweig. Prior to joining Rohde & Schwarz he worked as a Field Applications Engineer at LeCroy specializing in high-speed serial standards and signal integrity tests. He's also worked at Intel, leading product development in integrated silicon photonics devices, and as a research faculty at Georgia Tech working on millimeter Wave technology and equalizer ICs for fiber-optical communications systems.
1:00 PM – 1:40 PM	Synchronous Time and Frequency Domain Measurements Using a Digital Oscilloscope - Location: Mission City Ballroom M3 Embedded systems increasingly employ digital, analog and RF signals all of which are tightly synchronized in time. Debugging these systems is challenging in that one needs to measure a number of diffe… More ▶ Sponsored Session Presenter - Mike Schnecker, Business Development Manager, Rohde & Schwarz Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.
2:00 PM – 2:40 PM	USB 2.0 Compliance Testing - Location: Mission City Ballroom M3 The USB 2.0 standard is widely deployed in both computer and embedded systems. Compliance testing for this standard includes signal integrity as well as a number of low-level protocol tests. This sess… More ▶ Sponsored Session Presenter - Mike Schnecker, Business Development Manager, Rohde & Schwarz Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.
2:50 PM – 3:30 PM	Phase Noise and Jitter Measurements - Location: Mission City Ballroom M3 Jitter is a very important topic in signal integrity for high speed serial data links. The jitter performance of clock signals used in generating the serial data signal is critical to the overall perf… More ▶ Sponsored Session Presenter - Rick Daniel, Application Engineer, Rohde & Schwarz Rick Daniel has a BSEE from Texas Tech University and an MSEE from SMU. He has 30 years of experience in RF and microwave design and measurement with expertise in spectrum analysis, network analysis and communications. Prior to joining Rohde & Schwarz, Mr. Daniel held positions at Texas Instruments, Raytheon, HP and Agilent Technologies.
3:45 PM – 5:00 PM	Advances in 3D SI Simulations of Interconnects for Chip/Package/PCB - Location: Mission City Ballroom M1 Memory interfaces have single-ended data rates in the 1GHz-plus range and serial links are running upwards of 20Gbs. A precise analysis of each of these signals is required at silicon, package and boa… More ▶ Sponsored Session Presenter - Antonio Ciccomancini Scogna, EDA Market Development Manager, CST of America Antonio Ciccomancini Scogna received the Ph.D. degree in EE from the University of L’Aquila, Italy. He is currently EDA Market Development Manager at CST of America. His research interests include EM numerical modeling, printed and integrated circuits, packaging, SI and PI analysis in high-speed systems. Sponsored Session Presenter - Darryl Kostka, Application Engineer, CST of America, Inc. Darryl Kostka is currently working as an application engineer at CST of America, where he is involved in the signal integrity and power integrity analysis of high-speed digital systems, including packages and PCBs as well as electromagnetic compatibility/interference modeling. Kostka received his B.Eng. and M.Eng. degrees in electrical engineering from Carleton University, Ottawa, in 2006 and McGill University, Montreal, in 2009, respectively. Sponsored Session Presenter - Martin Schauer, Engineering Support Manager, CST of America, Inc. Martin Schauer received the PhD degree in EE from the Technische Universität Darmstadt in 2005. Currently he is working as Engineering Manager manager for CST of America. His main interests are numerical methods and their application towards low and high frequency electromagnetic problems. Sponsored Session Presenter - Richard Sjiariel, Application Engineer, CST of America, Inc. Richard Sjiariel studied EE at the University of Wuppertal and received his M.Sc. degree in 2006. The same year he joined CST as an Application Engineer, where his main area of applications includes Signal/Power Integrity, EMC/EMI Simulation and also other high frequency applications. True Differential S-parameter Measurements - Location: Mission City Ballroom M3 Differential structures such as backplanes and cables are the primary means for transmitting high speed serial data signals. Signal integrity of these systems is determined by the characteristics of t… More ▶ Sponsored Session Presenter - Chris Scholz, Ph.D, Product Manager, Rohde & Schwarz Chris Scholz has a Ph.D. (Electrical Engineering) and an MS from Georgia Tech, in addition to an MS from the TU Carolo-Wilhelmina in Braunschweig. Prior to joining Rohde & Schwarz he worked as a Field Applications Engineer at LeCroy specializing in high-speed serial standards and signal integrity tests. He's also worked at Intel, leading product development in integrated silicon photonics devices, and as a research faculty at Georgia Tech working on millimeter Wave technology and equalizer ICs for fiber-optical communications systems.
Wednesday, January 30
8:30 AM – 12:00 PM	Making DDR4 Work For You - Location: Mission City Ballroom M2 Designers who want to understand the challenges with DDR4 designs compared to DDR3 and what the most sensitive parameters of the channel that need special attention should attend this education forum.… More ▶ Sponsored Session Presenter - Perry Keller, Chairman of UFSA Compliance Committee, Agilent Technologies Sponsored Session Presenter - Heidi Barnes, Senior Application Expert, Agilent Technologies Heidi Barnes is a Senior Application Engineer for High Speed Digital applications in the EEsof EDA Group of Agilent Technologies. Past experience includes over 6 years in signal integrity for ATE test fixtures for Verigy, an Advantest Group, and 6 years in RF/Microwave microcircuit packaging for Agilent Technologies. She recently rejoined Agilent Technologies in April, and holds a Bachelor of Science degree in electrical engineering from the California Institute of Technology. Sponsored Session Presenter - Ai-Lee Kuan, Product Marketing Engineer, Agilent Technologies Sponsored Session Presenter - Jennie Grosslight, Senior Product Marketing Engineer, Agilent Technologies
3:00 PM – 4:30 PM	Debugging to Find the Root Cause of Compliance, Limit or Mask Test Violations - Location: Mission City Ballroom M1 Climbing bit rates and the emergence of multi-lane serial data standards result in tighter jitter and noise budgets and increase the possibility of mask and limit testing failures. When an otherwise c… More ▶ Sponsored Session Presenter - Alan Blankman, Ph.D., Technical Product Manager, Signal Integrity, Teledyne LeCroy Dr. Alan Blankman has developed instrumentation and software solutions for high-energy physicists and electrical engineers for over 20 years. He has a PhD degree in physics from University of Pennsylvania, and is currently focused on signal integrity products and applications, including the SPARQ series network analyzers and serial data analysis toolkits.

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