Executive Panel

Join us on Wednesday afternoon for a panel featuring three top industry executives and led by the editor in chief of Test & Measurement World and EDN, Patrick Mannion.

Delivering on Time-to-Answer: Meeting Designers Needs in Test & Measurement
Date: Wednesday, February 1, 2012
Time: 3:45pm – 5:00pm
Moderator: Patrick Mannion, Editor in Chief, Test & Measurement World and EDN
Panelists: Dave Graef, Vice President and Chief Technology Officer, LeCroy Corporation; Kevin Ilcisin, CTO, Tektronix; Greg Peters, GM and VP of Component Test Division, Agilent; and Eric Starkloff, vice president of systems platforms at National Instruments

Designers face ever-shorter time-to-market windows and consistently look to their test equipment for faster ‘time to answer’. Yet this requirement clearly flies in the face of the increasing complexity as designers deal with higher integration, multiple RF interfaces, multiple high-speed serial or parallel signaling protocols, multiple processors and a matrix of IC, board, software and system-level interactions and dependencies so fractal in nature that they frustrate even the most experienced test engineers and system designers.

Instead of looking at their design as though through a sieve, designers need clarity and instant system visibility. This panel pulls together the best minds in the industry to explore how this can be achieved. Join us as we discuss the nature of test, the interactions and issues designers face, how test technology is evolving to meet designers' needs and what lies ahead that you need to anticipate—now.