Agilent Education Forum

Agilent Education Forum

Attend one of two FREE education workshops at DesignCon 2012, brought to you by Agilent Technologies, Official Host Sponsor of the conference. You can REGISTER NOW for these events through the DesignCon registration process.

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Design and Test Challenges in Next Generation High-Speed Serial Standards (PCIe 3, DDR 3/4, USB 3, FPGA 28 Gbps serial ...)

SESSION ONE
Date: Monday, January 30, 2012
Time: 1:30pm – 4:30pm
Location: 2nd Floor Theater, Santa Clara Convention Center

SESSION TWO
Date: Wednesday, February 1, 2012
Time: 8:30am - 11:30am
Location: 2nd Floor Theater, Santa Clara Convention Center

Why This Forum is Important

Today’s leading serial designs require advanced tools during design and verification to ensure reliable, trouble free operation in production. Here’s a good chance to step through the challenges and the testing tools available in high-speed serial design workflow from design and simulation through turn on, debug, system test and compliance test.

Who Should Attend?

  • Anyone providing chipsets that include high-speed serial interconnects -- who need to ensure their designs will meet specifications and pass a validation or conformance stage before product release.
  • Any PC board or System designer utilizing a high-speed digital transmitter/receiver in a solution and must design/debug and validate the design.

Agenda for Both Sessions

  • Modeling and Simulation: Simulation to estimate the design impact of various choices in high speed serial design. Tying simulation and measurement to debug and perfect designs
  • Chip/Board Design: Understand and model the physical and electrical characteristics of passive components and interconnects even when physical probing is impossible.
  • Turn-on and stabilize: Steps in turn-on to ensure voltage and timing at turn-on, measure state/logic relationships and de-embed fixtures and other physical elements
  • Debug, validate and characterize: Eye timing, eye opening, skew, impacts of loading and temperature
  • System test: Time-effectively validate under as many system conditions as possible
  • Compliance: Standards compliance receiver testing for compliance
    Demonstrations using the following standards: PCIe Gen 3, USB 3.0, 28 Gbps FPGA serial link and DDR3/4

About Agilent

Agilent's high-speed digital solution set is a range of essential tools to help engineers Design & Simulate; Analyze, Debug and Ensure Compliant Designs while cutting through the challenges of gigabit digital designs. Our signal-integrity solutions address high-performance probing (with oscilloscopes, logic analyzers, TDRs, & network analyzers); high-speed interconnect analysis/simulation; jitter analysis; FPGA debug; Design & Test of DDR memory, USB, PCI Express, Serial-ATA, HDMI, DisplayPort, Gigabit Ethernet, Fiber Channel and much more. With Agilent, you'll be equipped to Pinpoint, Optimize and Deliver your designs on time.